Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 9783319266510
Release Date: 2016-08-24
Genre: Technology & Engineering

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Analytische Transmissionselektronenmikroskopie

Author: Jürgen Thomas
Publisher: Springer-Verlag
ISBN: 9783709114407
Release Date: 2013-01-05
Genre: Science

Die Autoren des Buches fassen ihre im Zuge vielseitiger Lehrtätigkeit gesammelten Erfahrungen zu häufig gestellten Fragen und Problemen von Anfängern im Umgang mit dem analytischen Transmissionselektronenmikroskop anschaulich zusammen. Dabei bilden Erklärungen anhand einfacher Modellvorstellungen und Hinweise zur praktischen Umsetzung des Erlernten die Schwerpunkte des Buches. Dieses praxisnahe Lehrbuch bietet somit eine klare und verständliche Einführung für all jene, die für Ihre Arbeit das Transmissionselektronenmikroskop verwenden wollen, jedoch noch nicht speziell dafür ausgebildet sind.

Encyclopedia of Analytical Science

Author:
Publisher: Elsevier
ISBN: 9780081019849
Release Date: 2019-04-02
Genre: Science

The third edition of the Encyclopedia of Analytical Science is a definitive collection of articles covering the latest technologies in application areas such as medicine, environmental science, food science and geology. Meticulously organized, clearly written and fully interdisciplinary, the Encyclopedia of Analytical Science provides foundational knowledge across the scope of modern analytical chemistry, linking fundamental topics with the latest methodologies. Articles will cover three broad areas: analytical techniques (e.g., mass spectrometry, liquid chromatography, atomic spectrometry); areas of application (e.g., forensic, environmental and clinical); and analytes (e.g., arsenic, nucleic acids and polycyclic aromatic hydrocarbons), providing a one-stop resource for analytical scientists. Offers readers a one-stop resource with access to information across the entire scope of modern analytical science Presents articles split into three broad areas: analytical techniques, areas of application and and analytes, creating an ideal resource for students, researchers and professionals Provides concise and accessible information that is ideal for non-specialists and readers from undergraduate levels and higher

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Release Date: 2011-03-24
Genre: Technology & Engineering

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 9781475725193
Release Date: 2013-03-09
Genre: Science

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

High Resolution Imaging and Spectrometry of Materials

Author: Frank Ernst
Publisher: Springer Science & Business Media
ISBN: 3540418180
Release Date: 2003-01-31
Genre: Science

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

Author: Channing C. Ahn
Publisher: John Wiley & Sons
ISBN: 9783527604777
Release Date: 2006-03-06
Genre: Science

This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

X Ray Metrology in Semiconductor Manufacturing

Author: D. Keith Bowen
Publisher: CRC Press
ISBN: 9781420005653
Release Date: 2018-10-03
Genre: Technology & Engineering

The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

Sample Preparation Handbook for Transmission Electron Microscopy

Author: Jeanne Ayache
Publisher: Springer Science & Business Media
ISBN: 0387981829
Release Date: 2010-07-03
Genre: Technology & Engineering

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Crystallography and Surface Structure

Author: Klaus Hermann
Publisher: John Wiley & Sons
ISBN: 9783527633319
Release Date: 2011-04-08
Genre: Science

A valuable learning tool as well as a reference, this book provides students and researchers in surface science and nanoscience with the theoretical crystallographic foundations, which are necessary to understand local geometries and symmetries of bulk crystals, including ideal single crystal surfaces. The author deals with the subject at an introductory yet mathematically sound level, providing numerous graphic examples to keep the math in context. The book brings together and logically connects many seemingly disparate structural issues and notations used frequently by surface scientists and nanoscientists. Numerous exercises of varying difficulty, ranging from simple questions to small research projects, are included to stimulate discussions about the different subjects.

4D Visualization of Matter

Author: Ahmed H Zewail
Publisher: World Scientific Publishing Company
ISBN: 9781783265046
Release Date: 2014-09-12
Genre: Science

Ever since the beginning of mankind's efforts to pursue scientific inquiry into the laws of nature, visualization of the very distant and the very small has been paramount. The examples are numerous. A century ago, the atom appeared mysterious, a “raisin or plum pie of no structure,” until it was visualized on the appropriate length and time scales. Similarly, with telescopic observations, a central dogma of the cosmos was changed and complexity yielded to simplicity of the heliocentric structure and motion in our solar system. For matter, in over a century of developments, major advances have been made to explore the inner microscopic structures and dynamics. These advances have benefited many fields of endeavor, but visualization was incomplete; it was limited either to the 3D spatial structure or to the 1D temporal evolution. However, in systems with myriads of atoms, 4D spatiotemporal visualization is essential for dissecting their complexity. The biological world is rich with examples, and many molecular diseases cannot be fully understood without such direct visualization, as, for example, in the case of Alzheimer's and Parkinson's. The same is true for phenomena in materials science, chemistry, and nanoscience. This anthology is an account of the collected works that have emerged over the past decade from Caltech. Through recent publications, the volume provides overviews of the principles, the electron-based techniques, and the applications made. Thanks to advances in imaging principles and technology, it is now possible with 4D electron microscopy to reach ten orders of magnitude improvement in time resolution while simultaneously conserving the atomic spatial resolution in visualization. This is certainly a long way from Robert Hooke's microscopy, which was recorded in his 1665 masterpiece Micrographia.

Transmission Electron Microscopy and Diffractometry of Materials

Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 9783662049013
Release Date: 2013-06-29
Genre: Technology & Engineering

This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.

Electron Microscopy of Nanotubes

Author: Zhong-lin Wang
Publisher: Springer Science & Business Media
ISBN: 9781461503156
Release Date: 2013-11-27
Genre: Technology & Engineering

Written by prominent scientists, this book is the first to specifically address the theory, techniques, and application of electron microscopy and associated techniques for nanotube research, a topic that is impacting a variety of fields, such as nanoelectronics, flat panel display, nanodevices, and novel instrumentation.

Transmission Electron Microscopy

Author: Ludwig Reimer
Publisher: Springer Science & Business Media
ISBN: 0387400931
Release Date: 2008-08-28
Genre: Science

The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.