Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 9783319266510
Release Date: 2016-08-24
Genre: Technology & Engineering

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Analytische Transmissionselektronenmikroskopie

Author: Jürgen Thomas
Publisher: Springer-Verlag
ISBN: 9783709114407
Release Date: 2013-01-05
Genre: Science

Die Autoren des Buches fassen ihre im Zuge vielseitiger Lehrtätigkeit gesammelten Erfahrungen zu häufig gestellten Fragen und Problemen von Anfängern im Umgang mit dem analytischen Transmissionselektronenmikroskop anschaulich zusammen. Dabei bilden Erklärungen anhand einfacher Modellvorstellungen und Hinweise zur praktischen Umsetzung des Erlernten die Schwerpunkte des Buches. Dieses praxisnahe Lehrbuch bietet somit eine klare und verständliche Einführung für all jene, die für Ihre Arbeit das Transmissionselektronenmikroskop verwenden wollen, jedoch noch nicht speziell dafür ausgebildet sind.

Physikalische Metallkunde

Author: P. Haasen
Publisher: Springer-Verlag
ISBN: 9783662127025
Release Date: 2013-03-14
Genre: Science

Seit 1959 versuche ich in Göttingen, Studierende der Physik nach dem V 01' examen für ein Aufbaustudium der Physikalischen Metallkunde zu interessieren. Diese Aufgabe stellt sich heute an vielen Hochschulen, denn allgemein hat sich der Beruf des Metallkundlers in der Forschung, der Entwicklung metallischer Werkstoffe und ihrer industriellen Produktion als sehr befriedigend und aus sichtsreich erwiesen. Nicht nur ist die Metall-Technik außerordentlich vielseitig und lädt zu wissenschaftlicher Durchdringung ein, sondern auch andere Bereiche der Festkörper-verarbeitenden Industrie benutzen unter der Überschrift" Werk stoffwissenschaften" (Materials Science) zunehmend metallkundliche Methoden, etwa bei keramischen Werkstoffen, Halbleitermaterialien, Kunststoffen usw. Für ein solches Berufsbild ist heute ein Grundstudium der Physik sehr geeignet, während Metallkundler früherer Jahrgänge häufig als Chemiker oder Maschinen bau-Ingenieure begonnen haben. Das Grundstudium der Physik bietet neben strengem mathematischen Rüstzeug verschiedene Vorlesungen und Praktika der Experimentalphysik sowie den theoretisch-physikalischen Kursus incl. der Quantentheorie. Im 5. und 6. Semester leiten Einführungsvorlesungen über Festkörperphysik in das Gebiet der Physikalischen Metallkunde über. Sie lehnen sich auch in Deutschland häufig an das Lehrbuch von Ch. Kittel [1.1] an.

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Release Date: 2011-03-24
Genre: Technology & Engineering

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 9781475725193
Release Date: 2013-03-09
Genre: Science

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Experimentalphysik 1

Author: Wolfgang Demtröder
Publisher: Springer-Verlag
ISBN: 9783662464151
Release Date: 2015-04-14
Genre: Science

"Mechanik und Wärme" ist der erste von vier Bänden zur Experimentalphysik von Professor Demtröder. Die Lehrinhalte des ersten Semesters Physik werden anschaulich und leicht verständlich, dabei aber möglichst quantitativ präsentiert. Wichtige Definitionen und Formeln, alle Abbildungen und Tabellen wurden zweifarbig gestaltet. Durchgerechnete Beispiele im Text, Kapitelzusammenfassungen sowie Übungsaufgaben mit ausführlichen Lösungen am Schluss des Buches helfen dabei, den Stoff zu bewältigen, und regen zu eigener Mitarbeit an. Die siebte Auflage wurde neu bearbeitet, korrigiert und weitgehend aktualisiert.

Grundlagen der Elektronenoptik

Author: Walter Glaser
Publisher: Springer-Verlag
ISBN: 9783662256992
Release Date: 2013-07-29
Genre: Technology & Engineering

Das vorliegende Buch beabsichtigt, in lehrbuchmäßiger Darstellung die theo retischen Grundlagen der Elektronenoptik darzulegen. Es sollen insbesondere die Methoden der theoretischen Elektronenoptik so ausführlich dargestellt werden, daß der Leser die weitere" Spezialliteratur kritisch verfolgen und selbständige Untersuchungen durchführen kann. Dem Techniker soll das Buch vor allem eine Hilfe bei der Lösung von Dimensionierungsfragen bieten. Besondere Vorkenntnisse werden weder aus der Elektronenphysik noch aus der geometrischen Optik vorausgesetzt. Die Darstellung kann vielmehr auch dem Studenten zur Einführung in diese Fachgebiete dienen, ja im dritten Teil auch einen ersten Zugang zur Wellenmechanik eröffnen. Die Wellenmechanik wurde in möglichst anschaulicher Weise als eine natürliche, durch neue experi mentelle Erfahrungen geforderte Verallgemeinerung der klassischen Mechanik entwickelt. Da an der jungen Wissenschaft der Elektronenoptik in gleicher Weise der Physiker, Techniker, Optiker und der Vertreter der angewandten Mathematik interessiert sind, das Buch also zwischen verschiedenen Disziplinen eine gewisse Mittlerrolle zu spielen hat, war es nötig, bei der Entwicklung der Grundlagen manchmal etwas weiter auszuholen.

High Resolution Imaging and Spectrometry of Materials

Author: Frank Ernst
Publisher: Springer Science & Business Media
ISBN: 3540418180
Release Date: 2003-01-31
Genre: Science

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Transmission Electron Microscopy and Diffractometry of Materials

Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 9783642297601
Release Date: 2012-10-14
Genre: Science

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

Author: Channing C. Ahn
Publisher: John Wiley & Sons
ISBN: 9783527604777
Release Date: 2006-03-06
Genre: Science

This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Aberration Corrected Analytical Transmission Electron Microscopy

Author: Rik Brydson
Publisher: John Wiley & Sons
ISBN: 9781119979906
Release Date: 2011-08-02
Genre: Science

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Author: Zhong-lin Wang
Publisher: Springer Science & Business Media
ISBN: 9781489915795
Release Date: 2013-06-29
Genre: Science

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.